PC-3000 Flash. How to detect and eliminate Bad Bytes

Posted on 06/04/2015 by ACELab team

All modern memory chips have a very low quality. It means that each new generation of memory chips have much more bad cells than previous generation. It happens because technological process which is used during memory chip production become smaller and smaller (firstly it was 65 nm (nanometres), than become 45nm, 32nm, 25nm, and now – 20nm and 18nm, 14nm), the cells inside chips become smaller and smaller, and the layer of isolation between cells become thinner. At the same time, developers could replaced bigger count of cells at the same area using the latest available techprocess, that’s why memory chips become cheaper and their capacity is grown up every year (but their quality become worse and worse).

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PC-3000 Flash. Hight temperature and problem chips – how to improve reading

Posted on 06/04/2015 by ACELab team

As we all know, most of modern TLC chips, produced by such companies as Toshiba, have problems with it’s reading. Sometimes, after dump reading is finished, we can see that data is seriously corrupted with bit errors, and unfortunately for their correction, ECC codes are not effective. Such memory chips contain too many errors, and the power of ECC codes is not enough for their correction. Even if we will try to use readout for data improvement, a lot of pages would be still damaged and not fixed.

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Posted in Articles, PC-3000 Flash | Tagged , , , , | 8 Comments